Polarization Integrated Infrared Detector and Imaging Based on MetaLens Structure
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1.School of Science,Shanghai University of Technology;2.School of Physics and Optoelectronic Engineering, Hangzhou Institute of Advanced Study, University of Chinese Academy of Science;3.National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences;4.Key Laboratory of Infrared System Detection and Imaging Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences

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    Abstract:

    Due to the close pixel size and working wavelength of the focal plane polarization integrated infrared detector, diffraction effects cause severe crosstalk between adjacent pixels with different polarized light. A single traditional metal grating structure cannot achieve high extinction ratio polarization detection chips. This article proposes and designs a metasurface lens stacked polarization integrated infrared detector structure, studies the optical field convergence ability of metalens for different wavelengths of infrared light waves, prepares metastructural lenses and submicron grating structures, and integrates them with infrared focal planes. The polarization extinction ratio of the device exceeds 15:1, and dynamic and variable temperature objects are selected for polarization imaging experiments, demonstrating the imaging advantages of polarization integrated devices with focal planes.

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History
  • Received:March 19,2025
  • Revised:May 06,2025
  • Adopted:May 07,2025
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